In situ 64Cu Doppler-broadening ...
|Title||In situ 64Cu Doppler-broadening positron-annihilation methods for elevated temperature study of defect formation in metals formation in metals|
|Author(s)||Derek W. Lawther, R. A. Dunlap|
|Journal||Canadian Journal of Physics|
|Abstract||Doppler-broadening positron-annihilation-spectroscopy experiment that utilizes an in situ Cu-64 source for the study of Cu and Cu-containing materials is described. This technique is particularly useful for the investigation of defect structure at elevated temperatures, and the present instrumentation provides reliable results up to about 1000 degrees C. The method described is applicable to Cu-containing samples with as little as about 0.1 at.% Cu. Results from measurements on a single crystal of elemental Cu are compared with literature results obtained using other positron-annihilation methods and electrical-resistivity studies.|
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