<?xml version="1.0" encoding="utf-8"?><rss version="2.0"><channel><title>An IslandScholar Citation Feed</title><link>http://vre2.upei.ca:8080/solr</link><description>
          A scholar's citation feed.
         </description><language>en-us</language><docs>http://vre2.upei.ca:8080/solr</docs><item><title>On the electrical deactivation of arsenic in silicon</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1696</link><description>Myler, U.; Simpson, P. J.; Lawther, Derek W.; Rousseau, P. M.; "On the electrical deactivation of arsenic in silicon", Journal of Vacuum Science &amp; Technology B, 1997, 3, 757</description><pubDate>2012-10-19T12:05:12.799Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1696</guid></item><item><title>Positron-beam techniques for materials characterization</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1762</link><description>Lawther, Derek W.; Simpson, P. J.; "Positron-beam techniques for materials characterization", Defect and Diffusion Forum, 1996, , 1</description><pubDate>2012-10-19T13:12:16.039Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1762</guid></item><item><title>Chemical information in positron annihilation spectra</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1697</link><description>Myler, U.; Goldberg, R. D.; Knights, A. P.; Lawther, Derek W.; Simpson, P. J.; "Chemical information in positron annihilation spectra", Applied Physics Letters, 1996, 22, 3333</description><pubDate>2012-10-19T13:40:42.845Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1697</guid></item><item><title>Positron beam study of annealed silicon nitride films</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1699</link><description>Landheer, D.; Aers, G. C.; Sproule, G. I.; Lawther, Derek W.; Simpson, P. J.; Massoumi, G. R.; Tong, S. Y.; "Positron beam study of annealed silicon nitride films", Journal of Applied Physics, 1996, 5, 2458</description><pubDate>2012-10-19T14:56:39.142Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1699</guid></item><item><title>Analysis of x-ray powder diffraction patterns of rapidly quenched A1-based alloys on the basis of quasicrystalline and cubic models</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1721</link><description>Dunlap, R. A.; Lawther, Derek W.; Srinivas, V.; "Analysis of x-ray powder diffraction patterns of rapidly quenched A1-based alloys on the basis of quasicrystalline and cubic models", Quasicrystals, networks, and molecules of fivefold symmetry, 1990, , 83</description><pubDate>2012-10-19T14:57:53.55Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1721</guid></item><item><title>Experimental identification of nitrogen-vacancy complexes in nitrogen implanted silicon</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1722</link><description>Adam, Lahir Shaik; Law, Mark E.; Szpala, Stanislaw; Simpson, P. J.; Lawther, Derek W.; Dokumaci, Omer; Hegde, Suri; "Experimental identification of nitrogen-vacancy complexes in nitrogen implanted silicon", Applied Physics Letters, 2001, , </description><pubDate>2012-11-04T05:28:06.883Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1722</guid></item><item><title>A Doppler broadening positron annihilation technique for the study of defects in bulk samples</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1698</link><description>Dunlap, R. A.; Kyriakidis, J.; Wang, Z.; Lawther, Derek W.; "A Doppler broadening positron annihilation technique for the study of defects in bulk samples", Nuclear Instruments &amp; Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, 1996, 3, 339</description><pubDate>2012-11-25T15:03:08.248Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1698</guid></item><item><title>Vacancy generation resulting from electrical deactivation of arsenic</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1700</link><description>Lawther, Derek W.; Myler, U.; Simpson, P. J.; Rousseau, P. M.; Griffin, P. B.; Plummer, J. D.; "Vacancy generation resulting from electrical deactivation of arsenic", Applied Physics Letters, 1995, 24, 3575</description><pubDate>2013-04-07T19:54:49.322Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1700</guid></item><item><title>In situ 64Cu Doppler-broadening positron-annihilation methods for elevated temperature study of defect formation in metals formation in metals</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1701</link><description>Lawther, Derek W.; Dunlap, R. A.; "In situ 64Cu Doppler-broadening positron-annihilation methods for elevated temperature study of defect formation in metals formation in metals", Canadian Journal of Physics, 1995, 1-2, 11</description><pubDate>2013-04-07T19:58:25.165Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1701</guid></item><item><title>Thermal expansion of Bi2.2Sr1.8CaCu2Ox superconductor single crystals</title><link>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1702</link><description>Yang, Z. J.; Yewondwossen, M.; Lawther, Derek W.; Ritcey, S. P.; Geldart, D. J. W.; Dunlap, R. A.; "Thermal expansion of Bi2.2Sr1.8CaCu2Ox superconductor single crystals", Journal of Superconductivity, 1995, 2, 233</description><pubDate>2013-04-07T19:59:43.061Z</pubDate><guid>
        http://islandscholar.ca/fedora/repository/ir:ir-batch6-1702</guid></item></channel></rss>